中文版 | English
Title

Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials

Author
Corresponding AuthorWang, Lin; Chen, Xiaolong
Publication Years
2022-07-09
DOI
Source Title
EISSN
2041-1723
Volume13Issue:1
Abstract
["Van der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer coupling in phosphorene and hexagonal boron nitride.","Atomically-thin van der Waals layered materials, with both high in-plane stiffness and bending flexibility, offer a unique platform for thermomechanical engineering. However, the lack of effective characterization techniques hinders the development of this research topic. Here, we develop a direct experimental method and effective theoretical model to study the mechanical, thermal, and interlayer properties of van der Waals materials. This is accomplished by using a carefully designed WSe2-based heterostructure, where monolayer WSe2 serves as an in-situ strain meter. Combining experimental results and theoretical modelling, we are able to resolve the shear deformation and interlayer shear thermal deformation of each individual layer quantitatively in van der Waals materials. Our approach also provides important interlayer coupling information as well as key thermal parameters. The model can be applied to van der Waals materials with different layer numbers and various boundary conditions for both thermally-induced and mechanically-induced deformations."]
URL[Source Record]
Indexed By
Language
English
Important Publications
NI Journal Papers
SUSTech Authorship
First ; Corresponding
Funding Project
open research fund of Songshan Lake Materials Laboratory[2021SLABFN02] ; National Natural Science Foundation of China["61904077","92064010","61801210","91833302"] ; National Key R&D Program of China[2020YFA0308900] ; Jiangsu Province[XYDXX-021]
WOS Research Area
Science & Technology - Other Topics
WOS Subject
Multidisciplinary Sciences
WOS Accession No
WOS:000822541400005
Publisher
Scopus EID
2-s2.0-85133726334
Data Source
Web of Science
Citation statistics
Cited Times [WOS]:0
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/355845
DepartmentDepartment of Electrical and Electronic Engineering
Affiliation
1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, 1088 Xueyuan Ave, Shenzhen 518055, Peoples R China
2.Nanjing Tech Univ Nanjing Tech, Key Lab Flexible Elect KLOFE, 30 South Puzhu Rd, Nanjing 211816, Peoples R China
3.Nanjing Tech Univ Nanjing Tech, Inst Adv Mat IAM, 30 South Puzhu Rd, Nanjing 211816, Peoples R China
First Author AffilicationDepartment of Electrical and Electronic Engineering
Corresponding Author AffilicationDepartment of Electrical and Electronic Engineering
First Author's First AffilicationDepartment of Electrical and Electronic Engineering
Recommended Citation
GB/T 7714
Zhang, Le,Wang, Han,Zong, Xinrong,et al. Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials[J]. NATURE COMMUNICATIONS,2022,13(1).
APA
Zhang, Le.,Wang, Han.,Zong, Xinrong.,Zhou, Yongheng.,Wang, Taihong.,...&Chen, Xiaolong.(2022).Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials.NATURE COMMUNICATIONS,13(1).
MLA
Zhang, Le,et al."Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials".NATURE COMMUNICATIONS 13.1(2022).
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