Title | Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials |
Author | |
Corresponding Author | Wang, Lin; Chen, Xiaolong |
Publication Years | 2022-07-09
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DOI | |
Source Title | |
EISSN | 2041-1723
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Volume | 13Issue:1 |
Abstract | ["Van der Waals materials exhibit unique thermomechanical properties, but interlayer deformations are usually challenging to measure. Here, the authors exploit the strain-dependent optical properties of monolayer WSe2 to quantitatively probe the interlayer shear thermal deformations and interlayer coupling in phosphorene and hexagonal boron nitride.","Atomically-thin van der Waals layered materials, with both high in-plane stiffness and bending flexibility, offer a unique platform for thermomechanical engineering. However, the lack of effective characterization techniques hinders the development of this research topic. Here, we develop a direct experimental method and effective theoretical model to study the mechanical, thermal, and interlayer properties of van der Waals materials. This is accomplished by using a carefully designed WSe2-based heterostructure, where monolayer WSe2 serves as an in-situ strain meter. Combining experimental results and theoretical modelling, we are able to resolve the shear deformation and interlayer shear thermal deformation of each individual layer quantitatively in van der Waals materials. Our approach also provides important interlayer coupling information as well as key thermal parameters. The model can be applied to van der Waals materials with different layer numbers and various boundary conditions for both thermally-induced and mechanically-induced deformations."] |
URL | [Source Record] |
Indexed By | |
Language | English
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Important Publications | NI Journal Papers
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SUSTech Authorship | First
; Corresponding
|
Funding Project | open research fund of Songshan Lake Materials Laboratory[2021SLABFN02]
; National Natural Science Foundation of China["61904077","92064010","61801210","91833302"]
; National Key R&D Program of China[2020YFA0308900]
; Jiangsu Province[XYDXX-021]
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WOS Research Area | Science & Technology - Other Topics
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WOS Subject | Multidisciplinary Sciences
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WOS Accession No | WOS:000822541400005
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Publisher | |
Scopus EID | 2-s2.0-85133726334
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Data Source | Web of Science
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Citation statistics |
Cited Times [WOS]:0
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Document Type | Journal Article |
Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/355845 |
Department | Department of Electrical and Electronic Engineering |
Affiliation | 1.Southern Univ Sci & Technol, Dept Elect & Elect Engn, 1088 Xueyuan Ave, Shenzhen 518055, Peoples R China 2.Nanjing Tech Univ Nanjing Tech, Key Lab Flexible Elect KLOFE, 30 South Puzhu Rd, Nanjing 211816, Peoples R China 3.Nanjing Tech Univ Nanjing Tech, Inst Adv Mat IAM, 30 South Puzhu Rd, Nanjing 211816, Peoples R China |
First Author Affilication | Department of Electrical and Electronic Engineering |
Corresponding Author Affilication | Department of Electrical and Electronic Engineering |
First Author's First Affilication | Department of Electrical and Electronic Engineering |
Recommended Citation GB/T 7714 |
Zhang, Le,Wang, Han,Zong, Xinrong,et al. Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials[J]. NATURE COMMUNICATIONS,2022,13(1).
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APA |
Zhang, Le.,Wang, Han.,Zong, Xinrong.,Zhou, Yongheng.,Wang, Taihong.,...&Chen, Xiaolong.(2022).Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials.NATURE COMMUNICATIONS,13(1).
|
MLA |
Zhang, Le,et al."Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials".NATURE COMMUNICATIONS 13.1(2022).
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