Title | Measurement of two-dimensional residual stress in nanocrystalline superelastic NiTi fabricated with pre-strain laser shock peening |
Author | |
Corresponding Author | Ren,Fuzeng |
Publication Years | 2022
|
DOI | |
Source Title | |
ISSN | 1081-2865
|
EISSN | 1741-3028
|
Volume | 27Pages:1559-1568 |
Abstract | The measurement of residual stress is a challenging issue in industrial fields. In this work, focused ion beam (FIB) and digital image correlation (DIC) are combined together to measure the two-dimensional residual stress in nanocrystalline NiTi plates processed with pre-strain laser shock peening (LSP). A four-point bending experiment verifies the accuracy of this measurement method. The pre-strain LSP-treated surfaces are found to have significant compressive residual stress along the pre-strain direction and tensile residual stress along the vertical to pre-strain direction, which verifies pre-strain LSP as an efficient approach to create gradient residual stress layers in nanocrystalline NiTi plates. The FIB-DIC method has also proven to be an attractive tool to measure the two-dimensional residual stress in phase transition nanocrystalline materials. |
Keywords | |
URL | [Source Record] |
Indexed By | |
Language | English
|
SUSTech Authorship | Corresponding
|
WOS Accession No | WOS:000792169200001
|
EI Accession Number | 20222012122303
|
EI Keywords | Binary alloys
; Focused ion beams
; Image analysis
; Nanocrystalline materials
; Nanocrystals
; Residual stresses
; Shape memory effect
; Titanium alloys
|
ESI Classification Code | Titanium and Alloys:542.3
; Nanotechnology:761
; Physical Properties of Gases, Liquids and Solids:931.2
; High Energy Physics:932.1
; Crystalline Solids:933.1
; Mechanical Variables Measurements:943.2
; Materials Science:951
|
ESI Research Field | ENGINEERING
|
Scopus EID | 2-s2.0-85132662050
|
Data Source | Scopus
|
Citation statistics |
Cited Times [WOS]:1
|
Document Type | Journal Article |
Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/356246 |
Department | Department of Materials Science and Engineering |
Affiliation | 1.Department of Mechanical and Aerospace Engineering,The Hong Kong University of Science and Technology,Hong Kong 2.Department of Mechanical and Aerospace Engineering,The Hong Kong University of Science and Technology,Hong Kong 3.State Key Laboratory for Manufacturing Systems Engineering,School of Mechanical Engineering,Xi’an Jiaotong University,Xi’an,China 4.Applied Mechanics and Structure Safety Key Laboratory of Sichuan Province,School of Mechanics and Engineering,Southwest Jiaotong University,Chengdu,China 5.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,China 6.Department of Mechanical and Aerospace Engineering,The Hong Kong University of Science and Technology,Hong Kong 7.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,China 8.Science and Technology on Plasma Dynamics Laboratory,Air Force Engineering University,Xi’an,China 9.HKUST Shenzhen-Hong Kong Collaborative Innovation Research Institute,Shenzhen,Futian,China |
First Author Affilication | Department of Materials Science and Engineering |
Corresponding Author Affilication | Department of Materials Science and Engineering |
Recommended Citation GB/T 7714 |
Yan,Kai,Wei,Pengbo,Chu,Kangjie,et al. Measurement of two-dimensional residual stress in nanocrystalline superelastic NiTi fabricated with pre-strain laser shock peening[J]. MATHEMATICS AND MECHANICS OF SOLIDS,2022,27:1559-1568.
|
APA |
Yan,Kai.,Wei,Pengbo.,Chu,Kangjie.,He,Weifeng.,Yu,Chao.,...&Sun,Qingping.(2022).Measurement of two-dimensional residual stress in nanocrystalline superelastic NiTi fabricated with pre-strain laser shock peening.MATHEMATICS AND MECHANICS OF SOLIDS,27,1559-1568.
|
MLA |
Yan,Kai,et al."Measurement of two-dimensional residual stress in nanocrystalline superelastic NiTi fabricated with pre-strain laser shock peening".MATHEMATICS AND MECHANICS OF SOLIDS 27(2022):1559-1568.
|
Files in This Item: | There are no files associated with this item. |
|
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment