中文版 | English
Title

Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film

Author
Corresponding AuthorWang, Dongbo; Chen, Lang
Publication Years
2022-07-01
DOI
Source Title
EISSN
2072-666X
Volume13Issue:7
Abstract
High Mg content (60%) ZnMgO samples with and without Ga dope were grown by an RF magnetron sputtering system. The effect of Ga dope on the ZnMgO sample and the respective ultraviolet photodetectors (UVPD) device's performance were carefully studied by various experimental methods. The investigations of the structure and optical properties of the ZnMgO sample established that the Ga doped sample has a better crystal quality and larger band gap (5.54 eV). The current-voltage characteristics indicate that both the photocurrent and dark current were enhanced after Ga dope. Under 12 V bias, the undoped UVPD show two spectral response peaks at 244 nm and 271 nm with a responsivity of 1.9 A/W and 0.38 A/W, respectively. While the Ga doped UVPD showed only one response peak at 241 nm and the deep UV responsibility up to 8.9 A/W;, as the bias increased from 12 V to 60 V, the responsiveness raised to 52 A/W, with a signal to noise ratio (241 nm/700 nm) as high as 10(5). Combining the results of XRD, PL spectrum and XPS, the enhanced ultraviolet photoresponse of the Ga dope device contributed to improving the crystal quality and "dopant-defect pairing effect" caused by Ga doping, which led to a considerable reduction in the number of ionized impurities in the scatting centers, and enhanced the carrier's mobility. Our work demonstrates that even a high Mg content ZnMgO can exhibit enhanced UV performance after a Ga dope due to the dopant-defect pairing effect, which confirmed the advantage of the use of ZnMgO in the deep-UV region.
Keywords
URL[Source Record]
Indexed By
SCI ; EI
Language
English
SUSTech Authorship
First ; Corresponding
Funding Project
Science and Technology Research Items of Shenzhen["JCYJ20180504165650580","JCYJ20190809142603695"]
WOS Research Area
Chemistry ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics
WOS Subject
Chemistry, Analytical ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Physics, Applied
WOS Accession No
WOS:000834477000001
Publisher
EI Accession Number
20223612702073
EI Keywords
Crystal impurities ; Crystal structure ; Current voltage characteristics ; Defects ; Energy gap ; Gallium ; Magnesium ; Magnetron sputtering ; Optical properties ; Semiconductor doping
ESI Classification Code
Magnesium and Alloys:542.2 ; Alkaline Earth Metals:549.2 ; Nonferrous Metals and Alloys excluding Alkali and Alkaline Earth Metals:549.3 ; Semiconducting Materials:712.1 ; Light/Optics:741.1 ; Crystal Lattice:933.1.1 ; Materials Science:951
Data Source
Web of Science
Citation statistics
Cited Times [WOS]:1
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/370411
DepartmentDepartment of Physics
Affiliation
1.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Peoples R China
2.Harbin Inst Technol, Sch Mat Sci & Engn, Dept Optoelect Informat Sci, Harbin 150001, Peoples R China
First Author AffilicationDepartment of Physics
Corresponding Author AffilicationDepartment of Physics
First Author's First AffilicationDepartment of Physics
Recommended Citation
GB/T 7714
Ye, Mao,Wang, Dongbo,Jiao, Shujie,et al. Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film[J]. MICROMACHINES,2022,13(7).
APA
Ye, Mao,Wang, Dongbo,Jiao, Shujie,&Chen, Lang.(2022).Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film.MICROMACHINES,13(7).
MLA
Ye, Mao,et al."Enhanced Deep Ultraviolet Photoresponse in Ga doped ZnMgO Thin Film".MICROMACHINES 13.7(2022).
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