中文版 | English
Title

Plasma-enabled electrochemical jet micromachining of chemically inert and passivating material

Author
Corresponding AuthorZhao, Yonghua
Publication Years
2022-12-01
DOI
Source Title
ISSN
2631-8644
EISSN
2631-7990
Volume4Issue:4
Abstract
Electrochemical jet machining (EJM) encounters significant challenges in the microstructuring of chemically inert and passivating materials because an oxide layer is easily formed on the material surface, preventing the progress of electrochemical dissolution. This research demonstrates for the first time a jet-electrolytic plasma micromachining (Jet-EPM) method to overcome this problem. Specifically, an electrolytic plasma is intentionally induced at the jet-material contact area by applying a potential high enough to surmount the surface boundary layer (such as a passive film or gas bubble) and enable material removal. Compared to traditional EJM, introducing plasma in the electrochemical jet system leads to considerable differences in machining performance due to the inclusion of plasma reactions. In this work, the implementation of Jet-EPM for fabricating microstructures in the semiconductor material 4H-SiC is demonstrated, and the machining principle and characteristics of Jet-EPM, including critical parameters and process windows, are comprehensively investigated. Theoretical modeling and experiments have elucidated the mechanisms of plasma ignition/evolution and the corresponding material removal, showing the strong potential of Jet-EPM for micromachining chemically resistant materials. The present study considerably augments the range of materials available for processing by the electrochemical jet technique.
Keywords
URL[Source Record]
Indexed By
SCI ; EI
Language
English
SUSTech Authorship
First ; Corresponding
Funding Project
National Key R&D Program of China[2021YFF0501700] ; National Natural Science Foundation of China[51905255] ; Project of Guangdong Provincial Department of Education[2019KTSCX152] ; Shenzhen Science and Technology Program[GJHZ20200731095204014]
WOS Research Area
Engineering ; Materials Science
WOS Subject
Engineering, Manufacturing ; Materials Science, Multidisciplinary
WOS Accession No
WOS:000837839500001
Publisher
EI Accession Number
20223412595489
EI Keywords
Boundary layers ; Micromachining ; Passivation ; Silicon carbide ; Wide band gap semiconductors
ESI Classification Code
Protection Methods:539.2.1 ; Machining Operations:604.2 ; Semiconducting Materials:712.1 ; Inorganic Compounds:804.2
Data Source
Web of Science
Citation statistics
Cited Times [WOS]:3
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/382286
DepartmentDepartment of Mechanical and Energy Engineering
Affiliation
Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Peoples R China
First Author AffilicationDepartment of Mechanical and Energy Engineering
Corresponding Author AffilicationDepartment of Mechanical and Energy Engineering
First Author's First AffilicationDepartment of Mechanical and Energy Engineering
Recommended Citation
GB/T 7714
Lu, Jiajun,Zhan, Shunda,Liu, Bowen,et al. Plasma-enabled electrochemical jet micromachining of chemically inert and passivating material[J]. International Journal of Extreme Manufacturing,2022,4(4).
APA
Lu, Jiajun,Zhan, Shunda,Liu, Bowen,&Zhao, Yonghua.(2022).Plasma-enabled electrochemical jet micromachining of chemically inert and passivating material.International Journal of Extreme Manufacturing,4(4).
MLA
Lu, Jiajun,et al."Plasma-enabled electrochemical jet micromachining of chemically inert and passivating material".International Journal of Extreme Manufacturing 4.4(2022).
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