中文版 | English
Title

Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique

Author
Corresponding AuthorCheng,Feng; Liu,Weishu
Publication Years
2022-11-01
DOI
Source Title
ISSN
2211-2855
EISSN
2211-3282
Volume102
Abstract
The thermal stability of the electrode interface is always a critical concern in the long-term service of thermoelectric power generators (TEGs). This work has systematically investigated the thermal stability of the interfaces of Ni/BiTeSe and Ni/BiSbTe of the BiTe-based Thermoelectric generator (TEG) device by using high-resolution transmission electron microscopy (HRTEM) with in-situ heating technique. Kirkendall voids (KVs) were directly observed in the electrode interfaces of both Ni/BiTeSe and Ni/BiSbTe, providing thus the microscopic reason for the naked-eye cracks causing thermal failure. The growth of KVs of the as-investigated interfaces shows multi-stage behavior. This effect is attributed to the superimposition of vacancy coalesce due to the interdiffusion and interface stress mechanisms owing to the plastic difference and volume shrinkage relative to the interface reaction. Among the various interface reactions, the reaction of 3Ni+2BiTe=3NiTe+4Bi has the largest volume shrinkage, and hence decisively affects the growth of KVs. An outlook relative to the design of the thermal stability is also provided from the point of view of reducing the local stress to suppress the formation of KVs, which is regarded as a valuable guideline for the electrode interface design of TEGs.
Keywords
URL[Source Record]
Indexed By
SCI ; EI
Language
English
SUSTech Authorship
Corresponding
Funding Project
National Natural Science Foundation of China[11874394];Natural Science Foundation of Anhui Province[2008085QA41];
WOS Research Area
Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
WOS Subject
Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS Accession No
WOS:000861074400002
Publisher
EI Accession Number
20223512631108
EI Keywords
Bismuth compounds ; Electrodes ; High resolution transmission electron microscopy ; Shrinkage ; Tellurium compounds ; Thermoelectric equipment ; Thermoelectric power
ESI Classification Code
Thermoelectric Energy:615.4 ; Thermodynamics:641.1 ; Optical Devices and Systems:741.3 ; Materials Science:951
Scopus EID
2-s2.0-85136518350
Data Source
Scopus
Citation statistics
Cited Times [WOS]:2
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/395008
DepartmentDepartment of Materials Science and Engineering
Affiliation
1.Information Materials and Intelligent Sensing Laboratory of Anhui Province,Institutes of Physical Science and Information Technology,Anhui University,Hefei,230601,China
2.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China
3.Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China
Corresponding Author AffilicationDepartment of Materials Science and Engineering;  Southern University of Science and Technology
Recommended Citation
GB/T 7714
Lin,Yangjian,Wu,Xinzhi,Li,Yuchen,et al. Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique[J]. Nano Energy,2022,102.
APA
Lin,Yangjian,Wu,Xinzhi,Li,Yuchen,Cheng,Feng,Liu,Weishu,&Ge,Binghui.(2022).Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique.Nano Energy,102.
MLA
Lin,Yangjian,et al."Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique".Nano Energy 102(2022).
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