Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique
|Corresponding Author||Cheng，Feng; Liu，Weishu|
The thermal stability of the electrode interface is always a critical concern in the long-term service of thermoelectric power generators (TEGs). This work has systematically investigated the thermal stability of the interfaces of Ni/BiTeSe and Ni/BiSbTe of the BiTe-based Thermoelectric generator (TEG) device by using high-resolution transmission electron microscopy (HRTEM) with in-situ heating technique. Kirkendall voids (KVs) were directly observed in the electrode interfaces of both Ni/BiTeSe and Ni/BiSbTe, providing thus the microscopic reason for the naked-eye cracks causing thermal failure. The growth of KVs of the as-investigated interfaces shows multi-stage behavior. This effect is attributed to the superimposition of vacancy coalesce due to the interdiffusion and interface stress mechanisms owing to the plastic difference and volume shrinkage relative to the interface reaction. Among the various interface reactions, the reaction of 3Ni+2BiTe=3NiTe+4Bi has the largest volume shrinkage, and hence decisively affects the growth of KVs. An outlook relative to the design of the thermal stability is also provided from the point of view of reducing the local stress to suppress the formation of KVs, which is regarded as a valuable guideline for the electrode interface design of TEGs.
National Natural Science Foundation of China;Natural Science Foundation of Anhui Province[2008085QA41];
|WOS Research Area|
Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics
Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
|WOS Accession No|
|EI Accession Number|
Bismuth compounds ; Electrodes ; High resolution transmission electron microscopy ; Shrinkage ; Tellurium compounds ; Thermoelectric equipment ; Thermoelectric power
|ESI Classification Code|
Thermoelectric Energy:615.4 ; Thermodynamics:641.1 ; Optical Devices and Systems:741.3 ; Materials Science:951
Cited Times [WOS]:2
|Document Type||Journal Article|
|Department||Department of Materials Science and Engineering|
1.Information Materials and Intelligent Sensing Laboratory of Anhui Province,Institutes of Physical Science and Information Technology,Anhui University,Hefei,230601,China
2.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China
3.Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China
|Corresponding Author Affilication||Department of Materials Science and Engineering; Southern University of Science and Technology|
Lin，Yangjian,Wu，Xinzhi,Li，Yuchen,et al. Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique[J]. Nano Energy,2022,102.
Lin，Yangjian,Wu，Xinzhi,Li，Yuchen,Cheng，Feng,Liu，Weishu,&Ge，Binghui.(2022).Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique.Nano Energy,102.
Lin，Yangjian,et al."Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique".Nano Energy 102(2022).
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