Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique

Lin，Yangjian1; Wu，Xinzhi2; Li，Yuchen2; Cheng，Feng1; Liu，Weishu2,3; Ge，Binghui1

2022-11-01

10.1016/j.nanoen.2022.107736

Nano Energy   Impact Factor & Quartile

2211-2855

2211-3282

The thermal stability of the electrode interface is always a critical concern in the long-term service of thermoelectric power generators (TEGs). This work has systematically investigated the thermal stability of the interfaces of Ni/BiTeSe and Ni/BiSbTe of the BiTe-based Thermoelectric generator (TEG) device by using high-resolution transmission electron microscopy (HRTEM) with in-situ heating technique. Kirkendall voids (KVs) were directly observed in the electrode interfaces of both Ni/BiTeSe and Ni/BiSbTe, providing thus the microscopic reason for the naked-eye cracks causing thermal failure. The growth of KVs of the as-investigated interfaces shows multi-stage behavior. This effect is attributed to the superimposition of vacancy coalesce due to the interdiffusion and interface stress mechanisms owing to the plastic difference and volume shrinkage relative to the interface reaction. Among the various interface reactions, the reaction of 3Ni+2BiTe=3NiTe+4Bi has the largest volume shrinkage, and hence decisively affects the growth of KVs. An outlook relative to the design of the thermal stability is also provided from the point of view of reducing the local stress to suppress the formation of KVs, which is regarded as a valuable guideline for the electrode interface design of TEGs.

Electrode interface In-situ heating TEM Interface structure Kirkendall voids Thermoelectrics

SCI ; EI

English

Corresponding

National Natural Science Foundation of China[11874394];Natural Science Foundation of Anhui Province[2008085QA41];

Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics

Chemistry, Physical ; Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied

WOS:000861074400002

ELSEVIER

20223512631108

Bismuth compounds ; Electrodes ; High resolution transmission electron microscopy ; Shrinkage ; Tellurium compounds ; Thermoelectric equipment ; Thermoelectric power

Thermoelectric Energy:615.4 ; Thermodynamics:641.1 ; Optical Devices and Systems:741.3 ; Materials Science:951

2-s2.0-85136518350

Scopus

1.Information Materials and Intelligent Sensing Laboratory of Anhui Province,Institutes of Physical Science and Information Technology,Anhui University,Hefei,230601,China
2.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China
3.Guangdong Provincial Key Laboratory of Functional Oxide Materials and Devices,Southern University of Science and Technology,Shenzhen,Guangdong,518055,China

Lin，Yangjian,Wu，Xinzhi,Li，Yuchen,et al. Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique[J]. Nano Energy,2022,102.

Lin，Yangjian,Wu，Xinzhi,Li，Yuchen,Cheng，Feng,Liu，Weishu,&Ge，Binghui.(2022).Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique.Nano Energy,102.

Lin，Yangjian,et al."Revealing multi-stage growth mechanism of Kirkendall voids at electrode interfaces of Bi2Te3-based thermoelectric devices with in-situ TEM technique".Nano Energy 102(2022).