中文版 | English
Title

Fracture Toughness Characterization of Thin Films Based on Finite Element Assisted Nanoindentation Technique

Author
DOI
Publication Years
2022
ISBN
978-1-6654-9906-4
Source Title
Pages
1-5
Conference Date
10-13 Aug. 2022
Conference Place
Dalian, China
Keywords
SUSTech Authorship
First
URL[Source Record]
Data Source
IEEE
PDF urlhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9873209
Citation statistics
Cited Times [WOS]:0
Document TypeConference paper
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/401540
DepartmentSchool of System Design and Intelligent Manufacturing
Affiliation
1.School of System Design and Intelligent Manufacturing, Southern University of Science and Technology, Shenzhen, China
2.Center for Engineering Materials and Reliability, Guangzhou HKUST Fok Ying Tung Research Institute, Guangzhou, China
3.Monolithic Power System, Chengdu, China
First Author AffilicationSchool of System Design and Intelligent Manufacturing
First Author's First AffilicationSchool of System Design and Intelligent Manufacturing
Recommended Citation
GB/T 7714
Weiquan Luo,Weijing Dai,Cheng Chen,et al. Fracture Toughness Characterization of Thin Films Based on Finite Element Assisted Nanoindentation Technique[C],2022:1-5.
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