| Title | 磁透镜调试方法和装置、计算机设备、存储介质 |
| Author | |
| Application Number | 202211320131.9
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| Application Date | 2022-10-26
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| Status of Patent | 实质审查
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| Subtype | 发明申请
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| SUSTech Authorship | First
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| Language | Chinese
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| Data Source | 人工提交
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| Document Type | Patent |
| Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/415802 |
| Department | Cryo-Electron Microscopy Center |
| Affiliation | 南方科技大学 |
| Recommended Citation GB/T 7714 |
马晓旻,付鲁堂,王培毅,等. 磁透镜调试方法和装置、计算机设备、存储介质.
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| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 1-磁透镜调试方法和装置、计算机设备、存（252KB） | Restricted Access | -- | ||||
| 2-权力要求书说明书说明书附图说明书摘要（447KB） | Restricted Access | -- | ||||
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