中文版 | English
Title

Air Stable High Mobility ALD ZnO TFT With HfO2 Passivation Layer Suitable For CMOS-BEOL Integration

Author
Corresponding AuthorM. Shen; Y. Li
Publication Years
2022-06
Conference Name
2022 IEEE CSTIC
Conference Date
2022-3
Conference Place
Shanghai, China
SUSTech Authorship
First ; Corresponding
Data Source
人工提交
Document TypeConference paper
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/415849
DepartmentSUSTech Institute of Microelectronics
Affiliation
1.Southern University of Science and Technology, Shenzhen 518055, China
2.Harbin Institute of Technology, Harbin 150001, China
First Author AffilicationSouthern University of Science and Technology
Corresponding Author AffilicationSouthern University of Science and Technology;  
First Author's First AffilicationSouthern University of Science and Technology
Recommended Citation
GB/T 7714
W. Wang,J. Lu,J. Lan,et al. Air Stable High Mobility ALD ZnO TFT With HfO2 Passivation Layer Suitable For CMOS-BEOL Integration[C],2022.
Files in This Item:
File Name/Size DocType Version Access License
Air_Stable_High_Mobi(3158KB) Restricted Access--
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