中文版 | English
Title

Quantifying the Value of Transient Voltage Sources

Author
Publication Years
2022-11-01
DOI
Source Title
ISSN
2331-7019
EISSN
2331-7019
Volume18Issue:5
Abstract
Some voltage sources are transient, lasting only for a moment of time, such as the voltage generated by converting a human motion into electricity. Such sources moreover tend to have a degree of randomness as well as internal resistance. We investigate how to put a number to how valuable a given transient source is. We derive several candidate measures via a systematic approach. We establish an interconvertibility hierarchy between such sources, where interconversion means adding passive interface circuits to the sources. Resistors at the ambient temperature are at the bottom of this hierarchy and sources with low internal resistance and high internal voltages are at the top. We provide three possible measures for a given source that assign a number to the source respecting this hierarchy. One measure captures how much "unitdc"the source contains, meaning 1 V dc with 1? internal resistance for 1 s. Another measure relates to the signal-to-noise ratio of the voltage time series, whereas a third is based on the relative entropy between the voltage probability distribution and a thermal noise resistor. We argue that the unitdc measure is particularly useful by virtue of its operational interpretation in terms of the number of unit dc sources that one needs to combine to create the source or that can be distilled from the source.
URL[Source Record]
Indexed By
Language
English
SUSTech Authorship
Others
Funding Project
[2019/35/B/ST2/01896] ; [12050410246] ; [12005091] ; [20200805101139001]
WOS Research Area
Physics
WOS Subject
Physics, Applied
WOS Accession No
WOS:000891296500002
Publisher
Scopus EID
2-s2.0-85143195843
Data Source
Scopus
Citation statistics
Cited Times [WOS]:0
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/416511
DepartmentDepartment of Physics
量子科学与工程研究院
Affiliation
1.Department of Computer Science,The University of Hong Kong,Hong Kong,Hong Kong
2.Shenzhen Institute for Quantum Science and Engineering,Department of Physics,SUSTech,Shenzhen,Nanshan District,China
3.Center for Theoretical Physics PAS,Warsaw,Aleja Lotników 32/46,02-668,Poland
First Author AffilicationDepartment of Physics;  Institute for Quantum Science and Engineering
Recommended Citation
GB/T 7714
Swati,,Singh,Uttam,Dahlsten,Oscar C.O.. Quantifying the Value of Transient Voltage Sources[J]. Physical Review Applied,2022,18(5).
APA
Swati,,Singh,Uttam,&Dahlsten,Oscar C.O..(2022).Quantifying the Value of Transient Voltage Sources.Physical Review Applied,18(5).
MLA
Swati,,et al."Quantifying the Value of Transient Voltage Sources".Physical Review Applied 18.5(2022).
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