Title | Quantifying the Value of Transient Voltage Sources |
Author | |
Publication Years | 2022-11-01
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DOI | |
Source Title | |
ISSN | 2331-7019
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EISSN | 2331-7019
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Volume | 18Issue:5 |
Abstract | Some voltage sources are transient, lasting only for a moment of time, such as the voltage generated by converting a human motion into electricity. Such sources moreover tend to have a degree of randomness as well as internal resistance. We investigate how to put a number to how valuable a given transient source is. We derive several candidate measures via a systematic approach. We establish an interconvertibility hierarchy between such sources, where interconversion means adding passive interface circuits to the sources. Resistors at the ambient temperature are at the bottom of this hierarchy and sources with low internal resistance and high internal voltages are at the top. We provide three possible measures for a given source that assign a number to the source respecting this hierarchy. One measure captures how much "unitdc"the source contains, meaning 1 V dc with 1? internal resistance for 1 s. Another measure relates to the signal-to-noise ratio of the voltage time series, whereas a third is based on the relative entropy between the voltage probability distribution and a thermal noise resistor. We argue that the unitdc measure is particularly useful by virtue of its operational interpretation in terms of the number of unit dc sources that one needs to combine to create the source or that can be distilled from the source. |
URL | [Source Record] |
Indexed By | |
Language | English
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SUSTech Authorship | Others
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Funding Project | [2019/35/B/ST2/01896]
; [12050410246]
; [12005091]
; [20200805101139001]
|
WOS Research Area | Physics
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WOS Subject | Physics, Applied
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WOS Accession No | WOS:000891296500002
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Publisher | |
Scopus EID | 2-s2.0-85143195843
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Data Source | Scopus
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Citation statistics |
Cited Times [WOS]:0
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Document Type | Journal Article |
Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/416511 |
Department | Department of Physics 量子科学与工程研究院 |
Affiliation | 1.Department of Computer Science,The University of Hong Kong,Hong Kong,Hong Kong 2.Shenzhen Institute for Quantum Science and Engineering,Department of Physics,SUSTech,Shenzhen,Nanshan District,China 3.Center for Theoretical Physics PAS,Warsaw,Aleja Lotników 32/46,02-668,Poland |
First Author Affilication | Department of Physics; Institute for Quantum Science and Engineering |
Recommended Citation GB/T 7714 |
Swati,,Singh,Uttam,Dahlsten,Oscar C.O.. Quantifying the Value of Transient Voltage Sources[J]. Physical Review Applied,2022,18(5).
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APA |
Swati,,Singh,Uttam,&Dahlsten,Oscar C.O..(2022).Quantifying the Value of Transient Voltage Sources.Physical Review Applied,18(5).
|
MLA |
Swati,,et al."Quantifying the Value of Transient Voltage Sources".Physical Review Applied 18.5(2022).
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