中文版 | English
Title

High-Voltage a-Si TFTs Using Dual-Gate With a Common Gate Structure by Channel Electrons Concentration Regulation

Author
Publication Years
2023
DOI
Source Title
ISSN
1557-9646
EISSN
1557-9646
VolumePPIssue:99Pages:1-5
Abstract
In this work, we report high-voltage amorphous silicon (a-Si) thin-film transistors (TFTs) using dual gate with a common gate structure, in which there are two extended electrodes with the same length at the junction of the two TFTs to regulate the electrons concentration in the channel. The working principle of the high-voltage a-Si TFTs is analyzed and their electrical performances are characterized. Results show that the high-voltage a-Si TFTs exhibit a maximum operating voltage (VDS) over 370 V and a stable output current. Meanwhile, the electrical performances of the high-voltage a-Si TFTs are not significantly degraded compared to the conventional a-Si TFTs. The fabrication process is similar to that of conventional a-Si TFTs and has low cost, which makes the high-voltage a-Si TFTs have broad application prospects in high-voltage electronics.
Keywords
URL[Source Record]
Indexed By
Language
English
SUSTech Authorship
First
Funding Project
National Natural Science Foundation of China[31927802] ; Outstanding Scientific and Technological Innovation Talent Program of Shenzhen[RCJC20200714114436046]
WOS Research Area
Engineering ; Physics
WOS Subject
Engineering, Electrical & Electronic ; Physics, Applied
WOS Accession No
WOS:000936253100001
Publisher
Data Source
IEEE
PDF urlhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10041860
Citation statistics
Cited Times [WOS]:0
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/442553
DepartmentDepartment of Materials Science and Engineering
Affiliation
Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen, China
First Author AffilicationDepartment of Materials Science and Engineering
First Author's First AffilicationDepartment of Materials Science and Engineering
Recommended Citation
GB/T 7714
Jiaze Liu,Rongyue Liu,Shaohu Zhan,et al. High-Voltage a-Si TFTs Using Dual-Gate With a Common Gate Structure by Channel Electrons Concentration Regulation[J]. IEEE Transactions on Electron Devices,2023,PP(99):1-5.
APA
Jiaze Liu,Rongyue Liu,Shaohu Zhan,Qin Luo,Rifei Chen,&Xing Cheng.(2023).High-Voltage a-Si TFTs Using Dual-Gate With a Common Gate Structure by Channel Electrons Concentration Regulation.IEEE Transactions on Electron Devices,PP(99),1-5.
MLA
Jiaze Liu,et al."High-Voltage a-Si TFTs Using Dual-Gate With a Common Gate Structure by Channel Electrons Concentration Regulation".IEEE Transactions on Electron Devices PP.99(2023):1-5.
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