| Title | Edge computing-based unified condition monitoring system for process manufacturing |
| Author | |
| Corresponding Author | Hu，Wenshan |
| Publication Years | 2023-03-01
|
| DOI | |
| Source Title | |
| ISSN | 0360-8352
|
| Volume | 177 |
| Abstract | Condition monitoring is of great practical significance in modern manufacturing. This paper presents the implementation of an edge computing-based unified condition monitoring system, which provides all-round services for condition monitoring. These services include monitoring algorithm design and generation, monitoring approaches, and monitoring interfaces. With a visualized interactive interface, the monitoring algorithms can be designed online, generated into executable programs, and then implemented into corresponding edge nodes. The edge computing nodes directly act on the real-time data from production equipment which can improve response time for efficient condition monitoring. During the monitoring process, the parameters of the monitoring algorithms can be adjusted and applied in real time. Besides, the monitoring interface can be configured freely with multiple widgets, including charts and video streaming. The feasibility and practicability of the proposed monitoring system have been demonstrated through a real aluminum cold rolling case in process manufacturing. |
| Keywords | |
| URL | [Source Record] |
| Language | English
|
| SUSTech Authorship | Others
|
| ESI Research Field | COMPUTER SCIENCE
|
| Scopus EID | 2-s2.0-85146542523
|
| Data Source | Scopus
|
| Citation statistics |
Cited Times [WOS]:0
|
| Document Type | Journal Article |
| Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/442634 |
| Department | Department of Electrical and Electronic Engineering |
| Affiliation | 1.School of Electrical Engineering and Automation,Wuhan University,Wuhan,430072,China 2.Department of Electronic and Electrical Engineering,Southern University of Science and Technology,Shenzhen,518055,China |
| Recommended Citation GB/T 7714 |
Xiao，Hui,Hu，Wenshan,Liu，Guoping,et al. Edge computing-based unified condition monitoring system for process manufacturing[J]. COMPUTERS & INDUSTRIAL ENGINEERING,2023,177.
|
| APA |
Xiao，Hui,Hu，Wenshan,Liu，Guoping,&Zhou，Hong.(2023).Edge computing-based unified condition monitoring system for process manufacturing.COMPUTERS & INDUSTRIAL ENGINEERING,177.
|
| MLA |
Xiao，Hui,et al."Edge computing-based unified condition monitoring system for process manufacturing".COMPUTERS & INDUSTRIAL ENGINEERING 177(2023).
|
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