Title | Thermally induced surface faceting on heteroepitaxial layers |
Author | |
Corresponding Author | Li,Lei |
Publication Years | 2023-02-21
|
DOI | |
Source Title | |
ISSN | 0021-8979
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EISSN | 1089-7550
|
Volume | 133Issue:7 |
Abstract | Heteroepitaxial semiconductors such as Ge-on-Si are widely used in current opto-electronic and electronic applications, and one of the most important challenges for epitaxial Ge-on-Si is threading dislocations (TDs) in Ge layers caused by lattice mismatch between Ge and Si. Here, apart from traditional wet chemical etching, we report a convenient approach to evaluate the threading dislocation densities in heteroepitaxial layers through vacuum thermal annealing. More importantly, the controversial origin of thermal annealing induced pits on a Ge surface was addressed in this work. By combining both experiments and density functional theory (DFT) calculations, we find that the {111} facets defined thermal pits on Ge (001) surfaces are mainly caused by threading dislocation activation. Ge adatoms at the TD segments sublimate preferentially than the ones on dislocation-free Ge (001) surface regions, and its further evolution is determined by surface energies of {111} facets, leading to a construction of inverted pyramid-shaped thermal pits. |
URL | [Source Record] |
Indexed By | |
Language | English
|
SUSTech Authorship | First
; Corresponding
|
Funding Project | National Natural Science Foundation of Guangdong Province[2022A1515010216]
; National Natural Science Foundation of China[52172294]
; "Shenzhen Science and Technology Innovation Commission"["JCYJ20210324105402007","20220815095607001"]
; Guangdong Provincial Innovation and Entrepreneurship Project[2017ZT07C071]
; Guangdong Provincial Key Laboratory Program from the Department of Science and Technology of Guangdong Province[2021B1212040001]
|
WOS Research Area | Physics
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WOS Subject | Physics, Applied
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WOS Accession No | WOS:000958356700012
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Publisher | |
ESI Research Field | PHYSICS
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Scopus EID | 2-s2.0-85148770796
|
Data Source | Scopus
|
Citation statistics |
Cited Times [WOS]:0
|
Document Type | Journal Article |
Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/497254 |
Department | Department of Materials Science and Engineering |
Affiliation | 1.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China 2.Department of Materials Engineering,The University of British Columbia (UBC),Vancouver,V6T 1Z4,Canada |
First Author Affilication | Department of Materials Science and Engineering |
Corresponding Author Affilication | Department of Materials Science and Engineering |
First Author's First Affilication | Department of Materials Science and Engineering |
Recommended Citation GB/T 7714 |
Zhang,Yiwen,Zhou,Chuan,Zhu,Ying,et al. Thermally induced surface faceting on heteroepitaxial layers[J]. JOURNAL OF APPLIED PHYSICS,2023,133(7).
|
APA |
Zhang,Yiwen,Zhou,Chuan,Zhu,Ying,Xia,Guangrui ,Li,Lei,&Wen,Rui Tao.(2023).Thermally induced surface faceting on heteroepitaxial layers.JOURNAL OF APPLIED PHYSICS,133(7).
|
MLA |
Zhang,Yiwen,et al."Thermally induced surface faceting on heteroepitaxial layers".JOURNAL OF APPLIED PHYSICS 133.7(2023).
|
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