中文版 | English
Title

Thermally induced surface faceting on heteroepitaxial layers

Author
Corresponding AuthorLi,Lei
Publication Years
2023-02-21
DOI
Source Title
ISSN
0021-8979
EISSN
1089-7550
Volume133Issue:7
Abstract
Heteroepitaxial semiconductors such as Ge-on-Si are widely used in current opto-electronic and electronic applications, and one of the most important challenges for epitaxial Ge-on-Si is threading dislocations (TDs) in Ge layers caused by lattice mismatch between Ge and Si. Here, apart from traditional wet chemical etching, we report a convenient approach to evaluate the threading dislocation densities in heteroepitaxial layers through vacuum thermal annealing. More importantly, the controversial origin of thermal annealing induced pits on a Ge surface was addressed in this work. By combining both experiments and density functional theory (DFT) calculations, we find that the {111} facets defined thermal pits on Ge (001) surfaces are mainly caused by threading dislocation activation. Ge adatoms at the TD segments sublimate preferentially than the ones on dislocation-free Ge (001) surface regions, and its further evolution is determined by surface energies of {111} facets, leading to a construction of inverted pyramid-shaped thermal pits.
URL[Source Record]
Indexed By
Language
English
SUSTech Authorship
First ; Corresponding
Funding Project
National Natural Science Foundation of Guangdong Province[2022A1515010216] ; National Natural Science Foundation of China[52172294] ; "Shenzhen Science and Technology Innovation Commission"["JCYJ20210324105402007","20220815095607001"] ; Guangdong Provincial Innovation and Entrepreneurship Project[2017ZT07C071] ; Guangdong Provincial Key Laboratory Program from the Department of Science and Technology of Guangdong Province[2021B1212040001]
WOS Research Area
Physics
WOS Subject
Physics, Applied
WOS Accession No
WOS:000958356700012
Publisher
ESI Research Field
PHYSICS
Scopus EID
2-s2.0-85148770796
Data Source
Scopus
Citation statistics
Cited Times [WOS]:0
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/497254
DepartmentDepartment of Materials Science and Engineering
Affiliation
1.Department of Materials Science and Engineering,Southern University of Science and Technology,Shenzhen,518055,China
2.Department of Materials Engineering,The University of British Columbia (UBC),Vancouver,V6T 1Z4,Canada
First Author AffilicationDepartment of Materials Science and Engineering
Corresponding Author AffilicationDepartment of Materials Science and Engineering
First Author's First AffilicationDepartment of Materials Science and Engineering
Recommended Citation
GB/T 7714
Zhang,Yiwen,Zhou,Chuan,Zhu,Ying,et al. Thermally induced surface faceting on heteroepitaxial layers[J]. JOURNAL OF APPLIED PHYSICS,2023,133(7).
APA
Zhang,Yiwen,Zhou,Chuan,Zhu,Ying,Xia,Guangrui ,Li,Lei,&Wen,Rui Tao.(2023).Thermally induced surface faceting on heteroepitaxial layers.JOURNAL OF APPLIED PHYSICS,133(7).
MLA
Zhang,Yiwen,et al."Thermally induced surface faceting on heteroepitaxial layers".JOURNAL OF APPLIED PHYSICS 133.7(2023).
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