中文版 | English
Title

Highly sensitive UV photodetector based on solution-processed bismuth oxyiodide epitaxial thin films

Author
Corresponding AuthorWang, Yihao
Publication Years
2023-02-01
DOI
Source Title
ISSN
2050-7526
EISSN
2050-7534
Abstract
Bismuth oxyhalides have attracted much attention in the field of optoelectronics because of their highly anisotropic crystal structure, tunable optical properties, and low toxicity. Few studies on the epitaxial growth of bismuth oxyhalides have been reported so far, however epitaxial thin films are suitable for investigating intrinsic properties and achieving device construction. In this study, we achieved the high quality epitaxial growth of BiOI thin film with thickness on the nanometer scale controllable via the deposition time. The bandgap of the BiOI exhibited a negative corelation with the film thickness owing to the quantum confinement effect. The as-fabricated photodetector based on the optimized thickness of the BiOI film exhibited high optoelectrical performance with a responsivity of 43.5 mA W-1 and normalized detectivity of 8.7 x 10(10) Jones under the illumination of 405 nm laser. Furthermore, the photoresponse mechanism of the BiOI photodetector was tuned from a photoconduction to photogating effect depending on the thickness of the epitaxial thin film. The high crystallinity and continuous surface morphology contribute to the generation of the photogating effect of the BiOI film. This study enriches the investigation of bismuth oxyhalides and paves the way towards the design of efficient bismuth-based semiconductor optoelectronic devices.
URL[Source Record]
Indexed By
Language
English
SUSTech Authorship
Corresponding
Funding Project
National Natural Science Foundation of China[52272161] ; WUT[2021IVA017B]
WOS Research Area
Materials Science ; Physics
WOS Subject
Materials Science, Multidisciplinary ; Physics, Applied
WOS Accession No
WOS:000943393400001
Publisher
Data Source
Web of Science
Citation statistics
Cited Times [WOS]:0
Document TypeJournal Article
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/513426
DepartmentDepartment of Physics
Affiliation
1.Wuhan Univ Technol, State Key Lab Adv Technol Mat Synth & Proc, Wuhan 430070, Peoples R China
2.Southern Univ Sci & Technol, Dept Phys, Shenzhen 518055, Peoples R China
Corresponding Author AffilicationDepartment of Physics
Recommended Citation
GB/T 7714
Sun, Zaichun,Wang, Yihao,Mei, Bingchu. Highly sensitive UV photodetector based on solution-processed bismuth oxyiodide epitaxial thin films[J]. Journal of Materials Chemistry C,2023.
APA
Sun, Zaichun,Wang, Yihao,&Mei, Bingchu.(2023).Highly sensitive UV photodetector based on solution-processed bismuth oxyiodide epitaxial thin films.Journal of Materials Chemistry C.
MLA
Sun, Zaichun,et al."Highly sensitive UV photodetector based on solution-processed bismuth oxyiodide epitaxial thin films".Journal of Materials Chemistry C (2023).
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