中文版 | English
Title

具有超级结栅结构的常关型氮化镓场效应管及其制造方法

Alternative Title
Normally-off gallium nitride field effect transistor with super junction gate structure and manufacturing method thereof
Author
First Inventor
化梦媛
Original applicant
南方科技大学
First applicant
南方科技大学
Address of First applicant
518000 广东省深圳市南山区学苑大道1088号
Current applicant
南方科技大学
Address of Current applicant
518000 广东省深圳市南山区学苑大道1088号 (广东,深圳,南山区)
First Current Applicant
南方科技大学
Address of First Current Applicant
518000 广东省深圳市南山区学苑大道1088号 (广东,深圳,南山区)
Application Number
CN201910135385.5
Application Date
2019-02-22
Open (Notice) Number
CN109888002A
Date Available
2019-06-14
Status of Patent
驳回
Legal Date
2023-04-25
Subtype
发明申请
SUSTech Authorship
First
Abstract
本发明提供了一种具有超级结栅结构的常关型氮化镓场效应管及制造方法,该常关型氮化镓场效应管包括半导体基底、氮化镓衬底、氮化镓沟道层、氮化镓铝势垒层、钝化层、第一栅介质层、第二栅介质层、控制栅、源极和漏极,第一栅介质层和所述第二栅介质层形成超级结接触。本发明的有益效果是:本发明的常关型氮化镓场效应管的栅极包含一个超级结。具体的栅结构包含第一栅介质层和第二栅介质层。其中第一栅介质层可将沟道中的电子耗尽,实现常关型接触。第二栅介质层在第一栅介质层之上,和第一栅介质层形成超级结接触。该超级结可以增大p型栅的耐压,并减小栅极漏电。更重要的是,该超级结具有雪崩击穿或者齐纳击穿能力,显著提高栅极可靠性。
Other Abstract
The invention provides a normally-off gallium nitride field effect transistor with a super junction gate structure and a manufacturing method thereof. The normally-off gallium nitride field effect transistor comprises a semiconductor substrate, a gallium nitride substrate, a gallium nitride channel layer, a gallium nitride aluminum barrier layer, a passivation layer, a first gate dielectric layer,a second gate dielectric layer, a control gate, a source electrode and a source electrode, wherein the first gate dielectric layer and the second gate dielectric layer form super junction contact. The normally-off gallium nitride field effect transistor has the beneficial effects that a gate electrode of the normally-off gallium nitride field effect transistor comprises a super junction; the specific gate structure comprises the first gate dielectric layer and the second gate dielectric layer; the first gate dielectric layer is capable of exhausting electrons in a channel to realize normally-off contact; the second gate dielectric layer is above the first gate dielectric layer and forms super junction contact with the first gate dielectric layer; the super junction is capable of enlargingthe voltage resistance of p-type gates and decreasing the electric leakage of the gate electrode; and more importantly, the super junction has avalanche breakdown or Zener breakdown ability, therebyremarkably improving the reliability of the gate electrode.
IPC Classification Number
H01L29/423 ; H01L29/778 ; H01L21/335 ; H01L21/28
INPADOC Legal Status
(ENTRY INTO FORCE OF REQUEST FOR SUBSTANTIVE EXAMINATION)[2019-07-09][CN]
INPADOC Patent Family Count
1
Extended Patent Family Count
1
Priority date
2019-02-22
Patent Agent
胡吉科
Agency
深圳市科吉华烽知识产权事务所(普通合伙)
URL[Source Record]
Data Source
PatSnap
Document TypePatent
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/531929
DepartmentDepartment of Electrical and Electronic Engineering
工学院_深港微电子学院
Recommended Citation
GB/T 7714
化梦媛,曾凡明,于洪宇,等. 具有超级结栅结构的常关型氮化镓场效应管及其制造方法.
Files in This Item:
There are no files associated with this item.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Export to Excel
Export to Csv
Altmetrics Score
Google Scholar
Similar articles in Google Scholar
[化梦媛]'s Articles
[曾凡明]'s Articles
[于洪宇]'s Articles
Baidu Scholar
Similar articles in Baidu Scholar
[化梦媛]'s Articles
[曾凡明]'s Articles
[于洪宇]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[化梦媛]'s Articles
[曾凡明]'s Articles
[于洪宇]'s Articles
Terms of Use
No data!
Social Bookmark/Share
No comment.

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.