南方科技大学知识苑(SUSTech KC): 用于透射电镜样品的多规格显微镜联动分析样品台

Title	用于透射电镜样品的多规格显微镜联动分析样品台
Alternative Title	Multi-specification microscope linkage analysis sample table for transmission electron microscope sample
Author	林君浩; 赵尔鼎
First Inventor	林君浩
Original applicant	南方科技大学
First applicant	南方科技大学
Address of First applicant	518055 广东省深圳市南山区西丽学苑大道1088号
Current applicant	南方科技大学
Address of Current applicant	518055 广东省深圳市南山区西丽学苑大道1088号 (广东,深圳,南山区)
First Current Applicant	南方科技大学
Address of First Current Applicant	518055 广东省深圳市南山区西丽学苑大道1088号 (广东,深圳,南山区)
Application Number	CN202121114193.5
Application Date	2021-05-21
Open (Notice) Number	CN214794536U
Date Available	2021-11-19
Publication Years	2021-11-19
Status of Patent	授权 ; 一案双申
Legal Date	2021-11-19
Subtype	实用新型
SUSTech Authorship	First
Abstract	本实用新型提供了一种用于透射电镜样品的多规格显微镜联动分析样品台，该样品台包括单元体、仪器兼容外壳、装配器。其中，单元体对TEM grid起到承载、固定作用；仪器兼容外壳有多种规格，其形状分别与所使用的仪器相适配，可固定单元体进而适用于不同的仪器中，实现多种仪器联用分析；装配器上开设三个固定槽，可直接固定TEM grid，也可固定单元体和仪器兼容外壳。本技术以TEM grid为基础，通过模块化的外部结构设计实现了对不同仪器的兼容，一次装入TEM grid后仅需更换相应的仪器兼容外壳即可在多个仪器之间联用。作为一种通用样品台方案，本技术适用于二维材料从转移制备到PLM观察、AFM表征、SEM分析的全过程，充分增强了实验的便利性并提高了实验效率。
Other Abstract	The utility model provides a multi-specification microscope linkage analysis sample stage for transmission electron microscope samples. The sample stage comprises a unit body, an instrument compatible shell and an assembler, wherein the unit body plays a role in bearing and fixing the TEM grid; the instrument compatible shell has various specifications, the shape of the instrument compatible shell is matched with the used instrument, the unit body can be fixed, then the instrument compatible shell is suitable for different instruments, and combined analysis of various instruments is achieved. Three fixing grooves are formed in the assembler, so that the TEM grid can be directly fixed, and the unit body and the instrument compatible shell can also be fixed. According to the technology, on the basis of the TEM grid, compatibility of different instruments is achieved through the modularized external structure design, and after the TEM grid is installed at a time, only the corresponding instrument compatible shell needs to be replaced, and the instrument compatible shell can be used among a plurality of instruments in a combined mode. As a general sample table scheme, the technology is suitable for the whole process of two-dimensional material transfer preparation, PLM observation, AFM characterization and SEM analysis, the experiment convenience is fully enhanced, and the experiment efficiency is improved.
IPC Classification Number	G01N23/04 ; G01N23/2251 ; G01N23/2202 ; G01N23/2206 ; G01N21/84
INPADOC Legal Status	（+PATENT GRANT）[2021-11-19][CN]
INPADOC Patent Family Count	3
Extended Patent Family Count	3
Priority date	2021-05-21
Patent Agent	曾敬
Agency	深圳市创富知识产权代理有限公司
URL	[Source Record]
Data Source	PatSnap
Document Type	Patent
Identifier	http://kc.sustech.edu.cn/handle/2SGJ60CL/532017
Department	Department of Physics
Recommended Citation GB/T 7714	林君浩,赵尔鼎. 用于透射电镜样品的多规格显微镜联动分析样品台[P]. 2021-11-19.

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