中文版 | English
Title

产品缺陷检测方法、装置、设备及存储介质

Alternative Title
Product defect detection method, device and equipment and storage medium
Author
First Inventor
贡毅
Original applicant
南方科技大学
First applicant
南方科技大学
Address of First applicant
518055 广东省深圳市南山区西丽学苑大道1088号
Current applicant
南方科技大学
Address of Current applicant
518055 广东省深圳市南山区西丽学苑大道1088号 (广东,深圳,南山区)
First Current Applicant
南方科技大学
Address of First Current Applicant
518055 广东省深圳市南山区西丽学苑大道1088号 (广东,深圳,南山区)
Application Number
CN202010102720.4
Application Date
2020-02-19
Open (Notice) Number
CN111325728A
Date Available
2020-06-23
Status of Patent
实质审查
Legal Date
2020-07-17
Subtype
发明申请
SUSTech Authorship
First
Abstract
本发明公开了一种产品缺陷检测方法、装置、设备及存储介质,涉及自动检测技术领域,其中,一种产品缺陷检测方法包括:获取待检测产品图像;采用大律算法对待检测产品图像进行处理,得到第一图像分割结果;采用高斯混合模型算法对待检测产品图像进行处理,得到第二图像分割结果;采用后处理算法对第一图像分割结果和第二图像分割结果进行处理,得到检测结果。本发明能够大幅度地提高检测速度,适用于不同类型产品的表面缺陷检测,还能够减小不同光源、检测件摆放角度和阴影情况等外界因素对检测结果的影响,实现对生产线产品缺陷的准确检测。
Other Abstract
The invention discloses a product defect detection method, device and equipment and a storage medium, and relates to the technical field of automatic detection. The product defect detection method comprises the steps that an image of a to-be-detected product is acquired; processing the to-be-detected product image by adopting a large-law algorithm to obtain a first image segmentation result; processing the to-be-detected product image by adopting a Gaussian mixture model algorithm to obtain a second image segmentation result; and processing the first image segmentation result and the second image segmentation result by adopting a post-processing algorithm to obtain a detection result. The method can greatly improve the detection speed, is suitable for surface defect detection of differenttypes of products, can reduce the impact on a detection result from external factors such as different light sources, the placement angle of a detection part and the shadow condition, and achieves theaccurate detection of the defects of a production line product.
CPC Classification Number
G06T7/0006 ; G06T7/11 ; G06T7/13 ; G06T7/155 ; G06T2207/10004
IPC Classification Number
G06T7/00 ; G06T7/11 ; G06T7/13 ; G06T7/155
INPADOC Legal Status
(ENTRY INTO FORCE OF REQUEST FOR SUBSTANTIVE EXAMINATION)[2020-07-17][CN]
INPADOC Patent Family Count
1
Extended Patent Family Count
1
Priority date
2020-02-19
Patent Agent
洪铭福
Agency
广州嘉权专利商标事务所有限公司
URL[Source Record]
Data Source
PatSnap
Document TypePatent
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/532829
DepartmentCollege of Engineering
Recommended Citation
GB/T 7714
贡毅,刘真榕. 产品缺陷检测方法、装置、设备及存储介质.
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