南方科技大学知识苑(SUSTech KC): 一种光镊测试介电泳力芯片及其制造方法、以及测试方法

Title	一种光镊测试介电泳力芯片及其制造方法、以及测试方法
Alternative Title	Chip for testing dielectrophoretic force through optical tweezers, manufacturing method of chip and testing method
Author	程鑫; 吴春卉; 徐俊彦; 陶超然; 黄凯程; 朴英哲 ; 陈日飞; 刘羽
First Inventor	程鑫
Original applicant	南方科技大学
First applicant	南方科技大学
Address of First applicant	518000 广东省深圳市南山区桃源街道学苑大道1088号
Current applicant	南方科技大学
Address of Current applicant	518000 广东省深圳市南山区桃源街道学苑大道1088号 (广东,深圳,南山区)
First Current Applicant	南方科技大学
Address of First Current Applicant	518000 广东省深圳市南山区桃源街道学苑大道1088号 (广东,深圳,南山区)
Application Number	CN202210672269.9
Application Date	2022-06-14
Open (Notice) Number	CN114921341A
Date Available	2022-08-19
Status of Patent	实质审查
Legal Date	2022-09-06
Subtype	发明申请
SUSTech Authorship	First
Abstract	本发明提供一种光镊测试介电泳力芯片及其制造方法、以及测试方法，一种光镊测试介电泳力芯片包括底部基板、位于所述底部基板上的电极层、位于电极层上的微孔阵列层和阵列设置的测试定位层；所述电极层包括相对设置的多对第一叉指电极和第二叉指电极，每对第一叉指电极和第二叉指电极之间具有间隙；所述微孔阵列层包括阵列设置的多个微孔；所述微孔位于所述第一叉指电极和第二叉指电极之间，每行第一叉指电极和第二叉指电极之间具有多个微孔；每行的微孔位于该行两个测试定位层之间。本发明光镊辅助分析芯片内微粒/细胞DEP，实现准确、高效、全面的单个微粒/细胞或者同时多个微粒/细胞的DEP行为的分析。
Other Abstract	The invention provides an optical tweezer test dielectrophoretic force chip, a manufacturing method thereof and a test method. The optical tweezer test dielectrophoretic force chip comprises a bottom substrate, an electrode layer located on the bottom substrate, a micropore array layer located on the electrode layer and test positioning layers arranged in an array mode. The electrode layer comprises a plurality of pairs of first interdigital electrodes and second interdigital electrodes which are oppositely arranged, and a gap is formed between each pair of first interdigital electrode and second interdigital electrode; the micropore array layer comprises a plurality of micropores arranged in an array; the micropores are located between the first interdigital electrodes and the second interdigital electrodes, and a plurality of micropores are formed between the first interdigital electrodes and the second interdigital electrodes in each row; and the micropores in each row are positioned between the two test positioning layers in the row. The optical tweezers assist in analyzing the DEP of the particles/cells in the chip, and accurate, efficient and comprehensive analysis of DEP behaviors of a single particle/cell or multiple particles/cells at the same time is achieved.
CPC Classification Number	C12M23/16 ; C12M47/04 ; C12M35/02 ; B01L3/502707 ; Y02P70/50
IPC Classification Number	C12M1/42 ; C12M1/00 ; B01L3/00
INPADOC Legal Status	（ENTRY INTO FORCE OF REQUEST FOR SUBSTANTIVE EXAMINATION）[2022-09-06][CN]
INPADOC Patent Family Count	1
Extended Patent Family Count	1
Priority date	2022-06-14
Patent Agent	满群
Agency	深圳市惠邦知识产权代理事务所
URL	[Source Record]
Data Source	PatSnap
Document Type	Patent
Identifier	http://kc.sustech.edu.cn/handle/2SGJ60CL/533783
Department	Department of Materials Science and Engineering 前沿与交叉科学研究院
Recommended Citation GB/T 7714	程鑫,吴春卉,徐俊彦,等. 一种光镊测试介电泳力芯片及其制造方法、以及测试方法.

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