中文版 | English
Title

Neuro-Modulated Hebbian Learning for Fully Test-Time Adaptation

Author
DOI
Publication Years
2023
ISSN
1063-6919
ISBN
979-8-3503-0130-4
Source Title
Pages
3728-3738
Conference Date
17-24 June 2023
Conference Place
Vancouver, BC, Canada
Keywords
SUSTech Authorship
First
URL[Source Record]
Indexed By
WOS Accession No
WOS:001058542604006
Data Source
IEEE
PDF urlhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10203770
Citation statistics
Cited Times [WOS]:0
Document TypeConference paper
Identifierhttp://kc.sustech.edu.cn/handle/2SGJ60CL/559176
DepartmentDepartment of Electrical and Electronic Engineering
Affiliation
1.Department of Electronic and Electrical Engineering, Southern University of Science and Technology, Shenzhen, China
2.Advanced Computing and Storage Laboratory, Huawei Technologies Co., Ltd., Shenzhen, China
First Author AffilicationDepartment of Electrical and Electronic Engineering
First Author's First AffilicationDepartment of Electrical and Electronic Engineering
Recommended Citation
GB/T 7714
Yushun Tang,Ce Zhang,Heng Xu,et al. Neuro-Modulated Hebbian Learning for Fully Test-Time Adaptation[C],2023:3728-3738.
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