Title | Smoothing of fused silica with less damage by a hybrid plasma process combining isotropic etching and atom-migration |
Author | |
Corresponding Author | Guo, Liang; Deng, Hui |
Publication Years | 2023-10-01
|
DOI | |
Source Title | |
ISSN | 2468-0230
|
Volume | 41 |
Abstract | In order to effectively reduce the subsurface damage of fused silica optics and obtain an ultra-smooth surface at atomic scale, we proposed a hybrid manufacturing process based on inductively coupled plasma (ICP), which combined isotropic etching polishing (IEP) and atom-migration manufacturing (AMM). In the plasma-IEP process, a large number of isotropic etching pits with ultra-smooth inner surface formed, enlarged, overlapped and merged, resulting in a smooth surface. The continuous downward etching process was accompanied by the continuous removal of the subsurface damage layer. With optimized process parameters, plasma-IEP could efficiently generate a less damage surface of fused silica with a material removal rate of 0.8 pm/min, and reduce the Sa roughness from 97.1 nm to 31.3 nm. The surface roughness could be further reduced to less than 0.15 nm by plasma-AMM, which was a non-subtractive finishing approach. The result of laser induced damage threshold (LIDT) test showed that the fused silica surface after the IEP-AMM hybrid manufacturing could withstand higher laser fluence, which implied more effective applications of this technique in high-power laser systems. This study proposed and verified the hybrid plasma manufacturing process combining plasma-IEP and plasma-AMM, which provided an ultra-smooth surface with less damage manufacturing process for fused silica. |
Keywords | |
URL | [Source Record] |
Indexed By | |
Language | English
|
SUSTech Authorship | First
; Corresponding
|
Funding Project | Natural Science Foundation of Guangdong Province[2023A1515011461]
; Science, Technology and Innovation Commission of Shenzhen Municipality["JCYJ20220818100412027","JCYJ20210324120402007"]
|
WOS Research Area | Chemistry
; Materials Science
; Physics
|
WOS Subject | Chemistry, Physical
; Materials Science, Coatings & Films
; Physics, Applied
; Physics, Condensed Matter
|
WOS Accession No | WOS:001060409300001
|
Publisher | |
Data Source | Web of Science
|
Citation statistics |
Cited Times [WOS]:0
|
Document Type | Journal Article |
Identifier | http://kc.sustech.edu.cn/handle/2SGJ60CL/559319 |
Department | Department of Mechanical and Energy Engineering 工学院_精密光学工程中心 |
Affiliation | 1.Southern Univ Sci & Technol, Dept Mech & Energy Engn, Shenzhen 518055, Guangdong, Peoples R China 2.Hong Kong Polytech Univ, Dept Ind & Syst Engn, State Key Lab Ultraprecis Machining Technol, Hung Hom,Kowloon, Hong Kong, Peoples R China 3.Southern Univ Sci & Technol, Inst Appl Opt & Precis Engn, Shenzhen 518055, Guangdong, Peoples R China |
First Author Affilication | Department of Mechanical and Energy Engineering |
Corresponding Author Affilication | Department of Mechanical and Energy Engineering; Inst Appl Opt & Precis Engn |
First Author's First Affilication | Department of Mechanical and Energy Engineering |
Recommended Citation GB/T 7714 |
Liang, Shaoxiang,He, Yi,Ding, Pengbo,et al. Smoothing of fused silica with less damage by a hybrid plasma process combining isotropic etching and atom-migration[J]. SURFACES AND INTERFACES,2023,41.
|
APA |
Liang, Shaoxiang,He, Yi,Ding, Pengbo,Wang, Chunjin,Guo, Liang,&Deng, Hui.(2023).Smoothing of fused silica with less damage by a hybrid plasma process combining isotropic etching and atom-migration.SURFACES AND INTERFACES,41.
|
MLA |
Liang, Shaoxiang,et al."Smoothing of fused silica with less damage by a hybrid plasma process combining isotropic etching and atom-migration".SURFACES AND INTERFACES 41(2023).
|
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