Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry

Wan, Zhen1; Li, Cheng1,2; Liu, Yang1; Liu, Yujian1; Xiao, Xi1; Han, Song3

2023-12-01

10.1016/j.apsusc.2023.158237

APPLIED SURFACE SCIENCE   Impact Factor & Quartile

0169-4332

1873-5584

Graphene optical applications rely on its exceptional optical characteristics, for which accurate measurement of graphene reflectivity is critical. Fabry-Perot (F-P) interferometry is a standard reflectivity measurement method with a simple structure, fast measurement speed, and high system plasticity. However, a strong coupling relationship exists between the coupling coefficient and the reflectivity of graphene in the F-P interferometry measurements of graphene reflectivity. Therefore, a method for measuring the reflectivity of thin graphene films using F-P interferometry with a compensation factor is proposed and experimentally demonstrated. Four alternative graphene film reflectivity solution models are established within four different F-P cavity lengths. The experimental results of the solution model with cavity lengths of 50-100 & mu;m show that the average reflectivity of single-layer, two-layer, five-layer, eight-layer, and ten-layer graphene films are 0.0131%, 0.101%, 0.793%, 1.335%, and 1.978% with the errors of 0.7%, 1.0%, 1.0%, 1.1%, and 1.1%, respectively. Meanwhile, the standard deviation of graphene reflectivity increases with the number of graphene layers. The highly consistent experimental data and comparative results confirmed the accuracy of our method. This method proposed in this paper could be further extended to measure the reflectivity of other 2-D materials.

Graphene film Optical reflectivity Fabry-Perot interference Coupling coefficient Compensation factor

SCI

English

Corresponding

National Natural Science Foundation of China[62173021] ; Beijing Natural Science Foundation[4212039] ; Aviation Science Foundation of China[2020Z073051002] ; Science Technology and Innovation Commission of Shenzhen Municipality[JCYJ20180504165721952] ; Science and Technology Innovation Commission of Shenzhen[JCYJ20200109141201714]

Chemistry ; Materials Science ; Physics

Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter

WOS:001061173200001

ELSEVIER

MATERIALS SCIENCE

Web of Science

1.Beihang Univ, Sch Instrumentat & Optoelect Engn, Beijing, Peoples R China
2.Univ Shenzhen, Res Inst Beihang, Shenzhen 518055, Peoples R China
3.Southern Univ Sci & Technol, Sch Innovat & Entrepreneurship, Shenzhen 518055, Peoples R China

Wan, Zhen,Li, Cheng,Liu, Yang,et al. Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry[J]. APPLIED SURFACE SCIENCE,2023,639.

Wan, Zhen,Li, Cheng,Liu, Yang,Liu, Yujian,Xiao, Xi,&Han, Song.(2023).Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry.APPLIED SURFACE SCIENCE,639.

Wan, Zhen,et al."Measuring optical reflectivity of graphene films using compensated Fabry-Perot interferometry".APPLIED SURFACE SCIENCE 639(2023).