X-ray characterization of just one atom: A pioneering accomplishment
Synchrotron X-ray characterization is a common practice in material research to accurately identify the distinctive characteristics at ultra-high resolution down to atomic level. In a recent issue of Nature, Saw Wai Hla et al. unveil the X-ray probing of a single atom, a groundbreaking discovery in material characterizations. This study utilized a specialized tip detector for X-ray signal detection generated from single iron and terbium atoms that confirms the atomically localized detection in the tunneling regime. While this is an incredible breakthrough for understanding the material properties at the single-atom level, it is still important to consider how it could be extended to other atoms and fields and how it may impact future research.
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|Department||Department of Mechanical and Energy Engineering|
Key Laboratory of Energy Conversion and Storage Technologies,Department of Mechanical and Energy Engineering,Southern University of Science and Technology,Shenzhen,518055,China
|First Author Affilication||Department of Mechanical and Energy Engineering|
|Corresponding Author Affilication||Department of Mechanical and Energy Engineering|
Zaman，Shahid. X-ray characterization of just one atom: A pioneering accomplishment. 2023-09-06.
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