ARPES studies of the band structures of topological insulators 拓扑绝缘体能带结构的角分辨光电子能谱研究

Hu，Jia Yuan5; Liu，Xiang Rui2,3; Liu，Chang2,3; Qian，Dong1,4

2023

10.1360/SSPMA-2022-0299

Scientia Sinica: Physica, Mechanica et Astronomica   Impact Factor & Quartile

1674-7275

2095-9478

The discovery of topological materials, defined by topological invariants, has revolutionized condensed matter physics and materials science. The robustness of the topological surface states, backscattering suppression, and novel transport behavior of these materials have potential applications in several fields, including spintronics, nonlinear optics, and topological quantum computation. Angle-resolved photoemission spectroscopy (ARPES) can provide the k space directly and is sensitive to surface electronic states, thus playing an essential role in the study of topological materials. This review summarizes selected ARPES studies of three-dimensional and intrinsic magnetic topological insulators in terms of material classification to provide the current research status in this field.

angle-resolved photoemission spectroscopy band structures surface states topological insulator

ESCI

Chinese

Corresponding

WOS:001023783100005

2-s2.0-85163586917

Scopus

1.School of Physics and Astronomy,Shanghai Jiao Tong University,Shanghai,200240,China
2.Department of Physics,Southern University of Science and Technology,Shenzhen,518055,China
3.Institute for Quantum Science and Engineering,Shenzhen,518048,China
4.Tsung-Dao Lee Institute,Shanghai Jiao Tong University,Shanghai,200240,China
5.

Hu，Jia Yuan,Liu，Xiang Rui,Liu，Chang,等. ARPES studies of the band structures of topological insulators 拓扑绝缘体能带结构的角分辨光电子能谱研究[J]. Scientia Sinica: Physica, Mechanica et Astronomica,2023,53(6).

Hu，Jia Yuan,Liu，Xiang Rui,Liu，Chang,&Qian，Dong.(2023).ARPES studies of the band structures of topological insulators 拓扑绝缘体能带结构的角分辨光电子能谱研究.Scientia Sinica: Physica, Mechanica et Astronomica,53(6).

Hu，Jia Yuan,et al."ARPES studies of the band structures of topological insulators 拓扑绝缘体能带结构的角分辨光电子能谱研究".Scientia Sinica: Physica, Mechanica et Astronomica 53.6(2023).